Prediction of soybean and snap bean seed germinability by electrical impedance spectroscopy
Electrical impedance spectroscopy (EIS) is a nondestructive analytical test and was used to predict seed germinability. Individual soybean (Glycine max L. (Merr.)) and snap bean (Phaseolus vulgaris L.) seeds were adjusted to 45% moisture content (fresh weight basis) and the impedance spectra were obtained at a frequency range from 60 Hz to 8 MHz both in longitudinal and lateral position. Each seed was tested for germination subsequent to this electrical scan. The impedance spectra differed both in magnitude and in characteristic shape for both positions and for both crops when plotted in the complex plane. With the exception of snap bean seeds measured along the longitudinal axis, seeds spectra were well characterized using a circuit modeled with three distributed elements. Longitudinally oriented snap bean spectra were best approximated with two distributed circuit elements in series with a resistor (Voigt model). Several EIS parameters obtained from partially imbibed seeds were predictive of subsequent seedling classifi cation (normal, or abnormal seedlings or dead seeds) in a germination test. The best predictors for soybeans were obtained at low frequency and in a lateral orientation and sensitive model parameters included R3, ψ3 and τ3. In snap beans, the best predictors were obtained in the lateral position and with parameter R3. Collectively, selected EIS parameters could accurately predict if a seed was non-germinable or germinable.
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Document Type: Research Article
Publication date: April 1, 2007
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