Technical Note: Effect of Ultrasonic Stress on Offset Voltage of Operational Amplifier Devices

Authors: Singh, V. R.; Prasad, Awadhesh

Source: Noise Control Engineering Journal, Volume 35, Number 2, 1 September 1990, pp. 65-67(3)

Publisher: Institute of Noise Control Engineering

DOI: https://doi.org/10.3397/1.2827770

No Abstract

Technical Note: Effect of Ultrasonic Stress on Offset Voltage of Operational Amplifier Devices

Document Type: Research Article

Affiliations: National Physical Laboratory

Publication date: 01 September 1990

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NCEJ is a peer reviewed Technical journal published every two months. The papers published in NCEJ cover general topics related to noise control engineering, ranging from fundamental research to applied case studies and histories.
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