Masking Patterns of Subcritical versus Critical Band-Maskers at 8.5 kHz
Masking patterns of steady state test-tones, masked by subcritical as well as critical bandmaskers at 8.5 kHz of equal intensity are determined. Two SPL's of the masker are considered., viz. 80 dB and 60 dB. The pattern of the subcritical band masker showed up to be inferior to the pattern of the critical band masker. A pure-tone masker and an extremely narrow noise masker (≦ 1/18 critical band wide) give rise to almost the same masking pattern. Subcritical bandmaskers exhibit steeper slopes of the masking pattern than the critical band-masker.
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Document Type: Research Article
Publication date: January 1, 1976
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- Acta Acustica united with Acustica, published together with the European Acoustics Association (EAA), is an international, peer-reviewed journal on acoustics. It publishes original articles on all subjects in the field of acoustics, such as general linear acoustics, nonlinear acoustics, macrosonics, flow acoustics, atmospheric sound, underwater sound, ultrasonics, physical acoustics, structural acoustics, noise control, active control, environmental noise, building acoustics, room acoustics, acoustic materials, acoustic signal processing, computational and numerical acoustics, hearing, audiology and psychoacoustics, speech, musical acoustics, electroacoustics, auditory quality of systems. It reports on original scientific research in acoustics and on engineering applications. The journal considers scientific papers, technical and applied papers, book reviews, short communications, doctoral thesis abstracts, etc. In irregular intervals also special issues and review articles are published.
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