Sizing in the phased array technique using diffraction and amplitude displacement
This report shows the results of experimental work carried out with the aim of improving defect analysis and sizing of both volumetric and planar defects, detected and imaged with the phased array probe technique. The phased array technique produces S-scan type images of defects which indicate easily the structure of the relevant echo indications. Depending on defect morphology, we can see diffracted echoes from planar defects, and also secondary echoes (improperly considered as diffracted echoes), generated by a complex conversion mode process, from volumetric ones. We can see also single indications, when defect height is comparable with ultrasonic wavelength or its complex geometry destroys diffracted or secondary indications, and, finally, we can see clustered indications. Thus, we have to recognise such different image structures in order to apply the most suitable sizing procedure. The obtained results are very satisfactory and allow us to be more confident in the application of the phased array technique.
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Document Type: Research Article
Affiliations: I&T Nardoni Institute, Via Cascina Pontevica n 21, cap 25010, Folzano Brescia, Italy. nardoninumerica.it, Tel: 39 030 266 582, Fax: 39 030 266 7429
Publication date: October 1, 2008
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- Official Journal of The British Institute of Non-Destructive Testing - includes original research and devlopment papers, technical and scientific reviews and case studies in the fields of NDT and CM.
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