Resolving capabilities of phased array sectorial scans (S-scans) on diffracted tip signals
This paper demonstrates the significant improvement available with phased array Sectorial (S-) scans for resolving crack tip signals using back-scattered diffraction on thinner plates. Initially, phased arrays and the factors affecting resolution are described, such as aperture and focusing. Another key feature is the use of piezo-composite array probes, which have shorter pulses. A third factor is S-scan imaging, which significantly improves crack tip signal identification. Some experiments show the resolving capabilities of phased arrays.
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Document Type: Research Article
Affiliations: 1: Davis NDE, 4060 Bent River Lane, Birmingham, AL, 35216, USA. 2: Olympus NDT, 73 Superior Avenue, Toronto, Ontario, M8V 2M7, Canada.
Publication date: April 1, 2006
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- Official Journal of The British Institute of Non-Destructive Testing - includes original research and devlopment papers, technical and scientific reviews and case studies in the fields of NDT and CM.
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