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Performance of Inverted Organic Solar Cells via Thickness Control of ZnO Thin Films

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For film thickness control, zinc oxide (ZnO) thin films were deposited by radio-frequency (RF) magnetron sputtering system on an indium tin oxide (ITO)-coated glass substrate with a pure ZnO target. The crystallinity nanostructure and surface morphology of the ZnO thin films were investigated by X-ray diffraction (XRD) and, scanning electron microscopy (SEM). With low coverage of the ZnO thin films, the grain size and surface roughness increased. We also studied the optical-electrical properties of the ZnO thin films such as carrier concentration, mobility, and resistivity by Hall measurement. As the coverage of the ZnO thin films increased, the concentration increased, but the mobility and resistivity decreased. Inverted organic solar cells (IOSE) with low coverage exhibited a short circuit current (J sc) of 6.2 mA/cm2, open circuit voltage (V oc) of 0.41 V and fill factor (FF) of 0.36 with an overall conversion efficiency of 1.98%.
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Keywords: HALL MEASUREMENT; ORGANIC SOLAR CELL; RF MAGNETRON SPUTTER; ZINC OXIDE

Document Type: Research Article

Publication date: March 1, 2016

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  • Science of Advanced Materials (SAM) is an interdisciplinary peer-reviewed journal consolidating research activities in all aspects of advanced materials in the fields of science, engineering and medicine into a single and unique reference source. SAM provides the means for materials scientists, chemists, physicists, biologists, engineers, ceramicists, metallurgists, theoreticians and technocrats to publish original research articles as reviews with author's photo and short biography, full research articles and communications of important new scientific and technological findings, encompassing the fundamental and applied research in all latest aspects of advanced materials.
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