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Improvement in Properties of Indium Tin Oxide Thin Films by Electron Beam Irradiation

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Indium tin oxide (ITO) thin films were conventionally prepared by using RF sputtering with 4 torr of Ar working pressure, and then annealed by electron beam irradiation as a rapid crystallization method. DC power was varied in the range of 1∼4 keV to control the density of electron dose, with fixed RF power of 200 W and 3 min of irradiation. The crystallinity of the samples was gradually improved with increase of the DC power, especially the crystalline direction of (222). The electrical properties of the electron beam irradiated ITO thin films were remarkably improved to achieve carrier concentrations of ∼1020 cm–3, Hall mobility of 31 ∼42 cm2/Vs, and resistivity of ∼10–4 Ω·cm. Simultaneously, improvement of the optical properties was also attained, such as increase of transmittance to ∼90% and of the optical bandgap from 3.46 to 4.07 eV. Electron beam irradiation onto ITO thin films as a rapid annealing method could be an excellent candidate for crystallization.
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Keywords: ANNEALING; E-BEAM IRRADIATION; INDIUM TIN OXIDE; TCO; THIN FILMS

Document Type: Research Article

Publication date: March 1, 2016

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  • Science of Advanced Materials (SAM) is an interdisciplinary peer-reviewed journal consolidating research activities in all aspects of advanced materials in the fields of science, engineering and medicine into a single and unique reference source. SAM provides the means for materials scientists, chemists, physicists, biologists, engineers, ceramicists, metallurgists, theoreticians and technocrats to publish original research articles as reviews with author's photo and short biography, full research articles and communications of important new scientific and technological findings, encompassing the fundamental and applied research in all latest aspects of advanced materials.
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