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Electrowetting Technique for Measuring the Thickness of Spin-Coated Hydrophobic Fluoropolymer Films

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For use as an analysis tool, the electrowetting technique was explored for measuring the thickness of thin hydrophobic dielectric films that were prepared by spin-coating a fluoropolymer resin in various weight percents on glass substrates coated with conductive tin-doped indium oxide (ITO-glass). We found that the film thickness was well fitted to a power law, yielding an exponent of 1.5, and that the results were in good agreement with those from the empirical deposit equation for the spin-coating technique. The X-ray reflectivity measurement also supported this method being very precise with a relative uncertainty of 9.2%, because this uncertainty is on the order of the roughness. These results indicate that this method can be used to find the thickness of thin hydrophobic and dielectric films on various conducting substrates. Conversely, the results of this report support the fact that the classical Young-Lippmann equation well describes the electrowetting on thin hydrophobic films well.
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Document Type: Research Article

Publication date: May 1, 2015

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  • Science of Advanced Materials (SAM) is an interdisciplinary peer-reviewed journal consolidating research activities in all aspects of advanced materials in the fields of science, engineering and medicine into a single and unique reference source. SAM provides the means for materials scientists, chemists, physicists, biologists, engineers, ceramicists, metallurgists, theoreticians and technocrats to publish original research articles as reviews with author's photo and short biography, full research articles and communications of important new scientific and technological findings, encompassing the fundamental and applied research in all latest aspects of advanced materials.
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