Visualization of Penetration of NanoSiO2 into Cement Paste Using X-ray Computed Tomography
The penetration of nanoSiO2 (NS) into cementitious materials to fill the capillary pores is a basic hypothesis when NS is used as a kind of surface-treatment agent. This hypothesis still needs direct experimental evidence. In this study, X-ray computed tomography (X-ray CT)
was applied to visualize NS transport in the surface treatment process. The quantitative measurements were made to show that the penetration depth of NS is around 8 mm. The agglomeration phenomenon of NS was observed directly. The results provide insight into the interpretation of the filling
effect, and present a new methodology to evaluate the effectiveness of nanoparticle surface-treatment agents akin to NS.
Keywords: CEMENT; NANOSIO2; SURFACE TREATMENT; X-RAY TECHNIQUE
Document Type: Short Communication
Publication date: 01 January 2018
- Nanoscience and Nanotechnology Letters (NNL) is a multidisciplinary peer-reviewed journal consolidating nanoscale research activities in all disciplines of science, engineering and medicine into a single and unique reference source. NNL provides the means for scientists, engineers, medical experts and technocrats to publish original short research articles as communications/letters of important new scientific and technological findings, encompassing the fundamental and applied research in all disciplines of the physical sciences, engineering and medicine.
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