Skip to main content
padlock icon - secure page this page is secure

Correlation Between Electrical Properties Degradation and Short-Channel Effects in Nano-Gate AlGaN/GaN High Electron Mobility Transistors

Buy Article:

$106.51 + tax (Refund Policy)

Based on the analysis of short-channel effects on Nano-gate AlGaN/GaN high electron mobility transistors (HEMTs), the key characteristics of device with gate-length ranging from 500 to 50 nm have been studied by numerical simulations. When the gate length (L g ) was reduced from 500 nm to 50 nm, a significant shift of threshold voltage, an increment of more than 3 orders of magnitude in sub-threshold current, a reduction of 39% of maximum DC transconductance and a reduction of 68% of f T ยทL g product can be observed. The relationship between the aspect ratio (the ratio of gate-length and the thickness of barrier layer) and degeneration of electrical properties is discussed in detail.
No Reference information available - sign in for access.
No Citation information available - sign in for access.
No Supplementary Data.
No Article Media
No Metrics

Keywords: ALGAN/GAN HEMT; ASPECT RATIO; NANO-GATE; SHORT-CHANNEL EFFECTS; SIMULATION

Document Type: Short Communication

Publication date: September 1, 2012

More about this publication?
  • Nanoscience and Nanotechnology Letters (NNL) is a multidisciplinary peer-reviewed journal consolidating nanoscale research activities in all disciplines of science, engineering and medicine into a single and unique reference source. NNL provides the means for scientists, engineers, medical experts and technocrats to publish original short research articles as communications/letters of important new scientific and technological findings, encompassing the fundamental and applied research in all disciplines of the physical sciences, engineering and medicine.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Ingenta Connect is not responsible for the content or availability of external websites
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more