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Open Access Growth mechanism of ZnO nanostructures for ultra-high piezoelectric d 33 coefficient

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A comparative morphological study of different ZnO nanostructures was carried out with different varying process parameters for energy harvesting. Molarity, temperature, growth duration and seed layer were such fundamental controlling parameters. The study brings out an outstanding piezoelectric coefficient (d 33) of 44.33 pm/V for vertically aligned ZnO nanorod structures, considered as the highest reported d 33 value for any kind of ZnO nanostructures. XRD analysis confirms wurtzite nature of this nanorod structure with [0001] as preferential growth direction. Semiconducting characteristic of nanorods was determined with temperature induced I/V characterization.
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Keywords: CURRENT/VOLTAGE (I/V) CHARACTERISTIC; NANOSTRUCTURES; PIEZOELECTRIC FORCE MICROSCOPY (PFM); SCANNING ELECTRON MICROSCOPY (SEM); X-RAY DIFFRACTION (XRD); ZNO

Document Type: Review Article

Publication date: December 1, 2013

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  • Materials Express is a peer-reviewed multidisciplinary journal reporting emerging researches on materials science, engineering, technology and biology. Cutting-edge researches on the synthesis, characterization, properties, and applications of a very wide range of materials are covered for broad readership; from physical sciences to life sciences. In particular, the journal aims to report advanced materials with interesting electronic, magnetic, optical, mechanical and catalytic properties for industrial applications.
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