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Features of Inelastic Interaction of X-Ray Radiation with Aligned Carbon Nanotube Films

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The aligned carbon nanotube (CNT) films on silicon substrate were synthesized by a thermolysis of the organic compound with a ferrocene as a catalyst. The angular dependence of X-ray fluorescence yield consisting mainly of CK radiation for the films was measured. The model curves were calculated to reveal the effect of the film density and thickness as well as the inclusion of iron nanoparticles on the X-ray radiation yield. A comparison of experimental data for the oriented and the disoriented nanotube films showed an extra intensity in the X-ray radiation yield in the direction of the nanotube growth. An influence of the CNT film structure parameters on the intensity increase is discussed based on the experimental results and the model calculations.

Keywords: CARBON NANOTUBES; X-RAY FLUORESCENCE YIELD; X-RAY SCATTERING

Document Type: Research Article

Publication date: 01 January 2012

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  • Journal of Nanoelectronics and Optoelectronics (JNO) is an international and cross-disciplinary peer reviewed journal to consolidate emerging experimental and theoretical research activities in the areas of nanoscale electronic and optoelectronic materials and devices into a single and unique reference source. JNO aims to facilitate the dissemination of interdisciplinary research results in the inter-related and converging fields of nanoelectronics and optoelectronics.
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