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Study on 3.3 kV Super Junction Field Stop Insulated Gate Bipolar Transistor According to Design and Process Parameters

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In this paper, we analyzed the electrical characteristics of 3.3 kV super junction FS IGBT as next generation power device by structural design. The device parameters were extracted by design and process simulation. Especially, to obtain optimal breakdown voltage, we researched the breakdown characteristic. To begin with, we confirmed that the breakdown voltage was decreased as trench depth was increased. And we analyzed the breakdown voltage according to p-pillar dose. As a result of experiment, we confirmed that the breakdown voltage was increased as p-pillar dose was increased. To obtain over 3.3 kV, the dose of p-pillar was 5×1013 cm−2, the resistivity of epi layer was 140 Ω·cm. We will extract design and process parameters considering on state voltage drop.

Keywords: 3.3 kV; Breakdown Voltage; FS IGBT; High Voltage; Pillar; Power Semiconductor; Super Junction

Document Type: Research Article

Affiliations: Department of Photovoltaic Engineering, Far East University, Chungbuk 369-700, Korea

Publication date: 01 March 2019

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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