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Electric Potentials of Vertical Flash Memory with a Macaroni Structure

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This paper presents the analytical electric potentials of vertical flash memory with a macaroni structure derived by solving a one-dimensional Pöisson equation for vertical flash memory. The solution provides the cross-sectional electric potentials between the surface and the inner oxide layer of the polysilicon channel in flash memory. The band bending and the charge density were obtained on the basis of the electric potential of the device, which is an important factor in flash memory operation. Additional parameters for the electric potentials in flash memory with a macaroni structure are described.

Keywords: Electric Potential; Macaroni MOSFET; Vertical Flash Memory

Document Type: Research Article

Affiliations: Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791, Korea

Publication date: 01 September 2018

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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