Characteristics of Ga-Rich Cu(In, Ga)Se2 Solar Cells Grown on Ga-Doped ZnO Back Contact
Wide bandgap Cu(In, Ga)Se2 (CIGS) thin films were deposited on Ga-rich Ga:ZnO (GZO) or MoN/GZO by single-stage co-evaporation. CIGS/TCO interface phases, such as resistive n-type Ga2O3, which are likely to have formed during the high temperature
growth of Ga-rich CIGS, can deteriorate the solar cell performance. Although some Ga accumulation was observed in both of the CIGS/GZO and CIGS/MoN/GZO interfaces formed at 520 °C, the Ga oxide layer was absent. On the other hand, their current–voltage characteristics showed strong
roll-over behavior regardless of the MoN diffusion barrier. The strong Schottky barrier formation at the CIGS/GZO junction due to the low work function of GZO, was attributed to current blocking at a high forward bias.
Keywords: CIGS; Diffusion Barrier; Ga-Doped ZnO; MoN; Superstrate
Document Type: Research Article
Affiliations: 1: School of Chemical Engineering, Yeungnam University, Gyeongsangbuk-do 712-749, Republic of Korea 2: Korea National Cleaner Production Center, Korea Institute of Industrial Technology, Seoul, 135-918, Republic of Korea
Publication date: 01 May 2016
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