Thickness Dependence Magnetization in Laser Ablated Ni–Cu–Zn Ferrite Nanostructured Thin Films
Ni0.5Cu0.3Zn0.2Fe2O4 thin films with thickness ranging from 25 nm to 500 nm were grown on Si substrate using pulsed laser deposition technique and their structural and magnetic properties were investigated. From the atomic force microscopy (AFM) analysis, it is observed that the film roughness (Ra) depends strongly on the thickness of the fabricated film. The magnetizations of the thin films were found to decrease when the film thickness increases. The thinner films showed a larger magnetization than the thick films. All the films showed a blocking temperature indicating their superparamagnetic behavior.
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Document Type: Research Article
Publication date: January 1, 2016
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