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Fabrication of Silicon Oxide Nanotips by Mechanical Contact and Elongation Methods

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We investigated the thinning process of silicon oxide tips by mechanical contact and elongation by in situ high-resolution transmission electron microscopy with functions of atomic force microscopy and scanning tunneling microscopy. The processing precision of thinning reached the atomic scale. However, the stability of the thinned tips determined their minimum size; the size of the produced tips was at least ∼1 nm. We produced thin, long nanotips for optical fiber probes by this method. We also performed the aperture opening of optical fiber probes for scanning near-field optical microscopy. Scraping produced an aperture of ∼15 nm.
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Document Type: Research Article

Publication date: February 1, 2011

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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