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AFM Nano-Plough Planar YBCO Micro-Bridges: Critical Currents and Magnetic Field Effects

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The critical current (I C) of YBa2Cu3O7−x (YBCO) AFM plough micro-constrictions is measured as a function of temperature, width and the magnetic flux density (B), which was applied perpendicular to the YBCO ab-plane and surface of the bridges. C-axis oriented thin films of YBa2Cu3O7−x were deposited on MgO substrates using an inverted cylindrical magnetron (ICM) sputtering technique. The films were then patterned into 8–10 micron size strips, using standard photolithography and dry etching processes. Micro-bridges with widths between 1.9 μm to 4.1 μm were fabricated by using atomic force microscope (AFM) nanolithography techniques. Critical current versus temperature data shows a straight-line behavior, which is typical of constriction type Josephson junctions. The I C versus B characteristics exhibited a modulation, and a suppression of the critical current of up to 84%. It was also found that the critical current increases with increasing constriction width.
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Document Type: Research Article

Publication date: October 1, 2010

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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