Length Control and Sharpening of Carbon Nanotube Scanning Probe Microscope Tips Using Carbon Nanotube "Nanoknife"
Through nanomanipulation inside scanning electron microscope, a carbon nanotube scanning probe microscope tip was made by connecting a carbon nanotube with a silicon atomic force microscope tip. The carbon nanotube scanning probe microscope tip was then tailored to the desired length and end structure by a "nanoknife," which is a carbon nanotube adhered to a metal tip. Through mapping the same carbon nanotube on SiO2 substrate, it was found that the lateral resolution of the carbon nanotube tips can be improved significantly through sharpening the tip ends, and the sharpened carbon nanotube tips had better performance than commercial silicon tips.
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Document Type: Research Article
Publication date: February 1, 2009
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- Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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