Atomic Ordering Kinetics of FePt Thin Films
In the present study, the nucleation and growth kinetics of the L10 ordered domains in FePt thin films were studied by using X-ray diffraction (XRD) measurements combined with transmission electron microscopy (TEM). A small nucleation activation energy En = (0.5 ± 0.1) eV and a relatively large growth activation energy Eg = (0.9 ± 0.1) eV for the L10 ordered domains are separately determined. The high ratio Eg /En > 1 yields an understanding of a high L10 ordering temperature for the FePt thin films used for magnetic recording media.
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Document Type: Research Article
Publication date: February 1, 2009
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