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Microstructural Properties of Phase-Change Ge2Sb2Te5 Nanoparticles Grown by Pulsed-Laser Ablation

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We have introduced in-situ growth of Ge2Sb2Te5 (GST) nanoparticles with 10 nm of average diameter by pulsed laser ablation directlyon Pt/Ir-coated AFM tips and investigated their microstructure and phase formation using scanning and transmission electron microscopy. In addition, Fourier transform analysis of electron micrographs discloses the crystal structure of the Ge2Sb2Te5 phase which has a lattice constant with ∼6 Å like bulk value of face-centered cubic and hexagonal structure.
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Document Type: Research Article

Publication date: February 1, 2009

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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