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Nanocrystalline Diamond Thin Films Deposited from C60 Monoenergetic Fullerene Ion Beam

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Carbon films 250÷500 nm in thickness deposited on Si wafers from mass-selected flow of accelerated C60 ions with energies of 5.0±0.1 keV at temperatures of 300 K and 673 K are characterized by TEM and nanoindentation. On the TEM images of the films deposited at 673K, nanocrystalline graphite with the typical grain size of ∼6 nm is observed. The films deposited at 300 K are transparent in visible light. TEM study of these films has revealed structural elements with lattice spacing close to that of diamond and the grain size of about 4 nm. Nanohardness and elastic modulus of the films prepared at a substrate temperature of 300 K were 23.1±0.2 GPa and 200±1 GPa, respectively. Possible mechanisms of the carbon films structure formation are suggested in the framework of a hydrodynamic shock wave model.
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Keywords: FULLERENE ION BEAM; NANOCRYSTALLINE DIAMOND THIN FILMS; SHOCK WAVE

Document Type: Research Article

Publication date: April 1, 2007

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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