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An Approach to Multi-Channel Accelerated Degradation Testing Data Process Based on Hierarchical Modeling

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Accelerated degradation testing (ADT) is commonly employed to shorten the reliability assessment period of long-life products. For integrated devices or other complex products, more levels can be found in their ADT data, which is defined as multi-channel data in this paper. As the multi-channel data are characterized by hierarchical structure, directional methods can be adopted. In this paper, hierarchical modeling, which was mainly applied to the areas of sociology, pedagogy and medicine, is applied to the multi-channel data process. General models for both normal ADT data and multichannel data will be given first. Then, a brief flow of an approach based on hierarchical modeling to multi-channel data process will be shown. Eventually, the proposed approach will be demonstrated by a real case of optoelectronic coupler storage ADT.
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Keywords: Degradation Data Process; Hierarchical Modeling; Multi-Channel Data

Document Type: Research Article

Affiliations: School of Reliability and System Engineering, Beihang University, Beijing, 100191, China

Publication date: September 1, 2016

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  • Journal of Computational and Theoretical Nanoscience is an international peer-reviewed journal with a wide-ranging coverage, consolidates research activities in all aspects of computational and theoretical nanoscience into a single reference source. This journal offers scientists and engineers peer-reviewed research papers in all aspects of computational and theoretical nanoscience and nanotechnology in chemistry, physics, materials science, engineering and biology to publish original full papers and timely state-of-the-art reviews and short communications encompassing the fundamental and applied research.
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