Surface Characterizations Using Optical Microscope and Atomic Microscope of WSe2 Crystals
In recent years, much attention has been given to various transition metal dichalcogenides (TMDCs) because of their interesting semiconducting characteristics. The layer type TMDCs are important solid since they display a whole spectrum of electronic properties covering semiconductors, metals, insulators and superconductors. Atomic Force Microscopy (AFM) provides numerical data of surface height at digitized locations, which are usable for various surface characterizations. Atomic Force Microscopy (AFM) is extensively being used for characterizing of surfaces. In addition to direct imaging, AFM data enable to derive the Power Spectral Density (PSD) of the surface roughness and thus provide useful information on characteristic features which compose the microstructure. In the present work PSD spectra computed from AFM data were used for studying the morphology. Atomic Force Microscopy (AFM) provides numerical data of surface height at digitized locations, which are usable for various surface characterizations. In this paper, the results have been analyzed to draw some conclusions which are also presented here.
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Document Type: Research Article
Publication date: June 1, 2013
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