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Jet Nebuliser Technique to Prepare Nickel Oxide Thin Films and Its Characterisations

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Nickel oxide thin films were prepared by Jet nebuliser Technique, the structural, morphological, and optical properties of the NiO thin films were characterized and the results are presented. The thin films were characterized by using XRD, XPS, UV-Vis, PL, SEM, TEM to study the structural, elemental analysis, bandgap, emission wavelengths and morphological studies of it. We discussed detailed about these characterization here.
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Keywords: ANNEALED SAMPLES; NIO; PHOTOLUMINESCENCE SPECTROMETER; TEM

Document Type: Research Article

Publication date: March 1, 2018

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  • Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.
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