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High Definition Image Acquisition for Automatic Optical Inspection Using Light Sources Characteristics

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Major parts of an automatic optical inspection (AOI) system, which is widely used in chip-on-glass modules, are differential interference contrast (DIC) microscope, light source, and a camera. This paper describes the relationship between DIC microscope and three major light sources—halogen, xenon, LED—with line scan and area camera. It is verified that there is a periodic change in the mean gray-scale value of the acquired image in accordance with the displacement of the DIC prism slider for both the line scan and area cameras. Each light source has a characteristic periodic pattern. Among the three light sources, LED shows excellent detecting ability and accuracy ratio on indentation marks for both line scan and area camera. Considering low power consumption, longer lifetime, and cheaper price of LED, it is highly recommended in conjunction with a line scan camera for an AOI system in a factory setting.
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Keywords: AOI; COG; DIC; Indentation Marks; Light Source

Document Type: Research Article

Affiliations: 1: Department of Electronic and Electrical Engineering, Catholic University of Daegu, Gyeongbuk 38430, Korea 2: R&D Center, Utosys Co. Ltd., Gyeongbuk 39155, Korea

Publication date: July 1, 2018

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  • ADVANCED SCIENCE LETTERS is an international peer-reviewed journal with a very wide-ranging coverage, consolidates research activities in all areas of (1) Physical Sciences, (2) Biological Sciences, (3) Mathematical Sciences, (4) Engineering, (5) Computer and Information Sciences, and (6) Geosciences to publish original short communications, full research papers and timely brief (mini) reviews with authors photo and biography encompassing the basic and applied research and current developments in educational aspects of these scientific areas.
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