Analysis of AOI System Parameters for FOG Image Enhancement
Surface defect detection techniques are widely used and play very important roles in many fields such as a precision optical element used in high energy laser, a wafer used in a semiconductor, a cover glass used in a mobile phone, and an anisotropic conductive film (ACF) used in a liquid crystal display (LCD). In this paper, we investigate the influence of the parameters of an image processing system through experiments to improve flex on glass (FOG) image reading, and describe how to set up and use the system for image enhancement. In other words, we examine the influence of changes in CogCenter, Ret, and Position in the graphic user interface of the used image processing system to improve the image quality and propose how to use it. Furthermore, we verify the effectiveness of image quality through experiments.
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Document Type: Research Article
Affiliations: 1: Department of Electronic and Electrical Engineering, Catholic University of Daegu, Gyeongbuk 38430, Korea 2: R&D Center, Utosys Co. Ltd., Gyeongbuk 39155, Korea
Publication date: July 1, 2018
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