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Applicability of Thermally Stimulated Currents Technique to Estimate Light Induced Meta-Stable Defects in A-Se90In2Ag8 Thin Films

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Present study reports the quantitative estimation of light induced defects in vacuum evaporated thin films of Se90In2Ag8 by using thermally stimulated current (TSC) technique. These Measurements have been made in a vacuum ~10−3 Torr before and after exposing amorphous films to white light for different exposure times from 0 to 1.5 hours. It is found that the density of light induced defects increases with the exposure time.
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Keywords: Light Induced Defects; Thermally Stimulated Current; Thin Film

Document Type: Research Article

Affiliations: 1: Department of Physics, Harcourt Butler Technological Institute, Kanpur, India 2: Department of Physics, J. S. S. Academy of Technical Education, Noida, India

Publication date: November 1, 2016

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