Applicability of Thermally Stimulated Currents Technique to Estimate Light Induced Meta-Stable Defects in A-Se90In2Ag8 Thin Films
Present study reports the quantitative estimation of light induced defects in vacuum evaporated thin films of Se90In2Ag8 by using thermally stimulated current (TSC) technique. These Measurements have been made in a vacuum ~10−3 Torr before and after exposing amorphous films to white light for different exposure times from 0 to 1.5 hours. It is found that the density of light induced defects increases with the exposure time.
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Document Type: Research Article
Affiliations: 1: Department of Physics, Harcourt Butler Technological Institute, Kanpur, India 2: Department of Physics, J. S. S. Academy of Technical Education, Noida, India
Publication date: November 1, 2016
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