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Electrical Properties of Double Perovskite Ho2NiZrO6

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The double perovskite oxide Holmium nickel zirconate, Ho2NiZrO6 (HNZ) is synthesized by a solid-state reaction technique. The X-ray diffraction pattern of the sample at room temperature shows a monoclinic phase. The field dependence of dielectric response and the loss tangent of the sample are measured in a frequency range from 100 Hz to 1 MHz and in a temperature range from 313 K to 723 K. An analysis of the real and imaginary parts of the dielectric permittivity with frequency is performed, assuming a distribution of relaxation times as confirmed by Cole-Cole plots. The frequency dependence of loss peaks is found to obey an Arrhenius law with the activation energy of 0.381 eV.
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Keywords: DIELECTRIC RELAXATION; DIELECTRIC SPECTROSCOPY; ELECTRICAL PROPERTIES; PEROVSKITE

Document Type: Research Article

Publication date: February 1, 2016

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