Philosophical Magazine

Philosophical Magazine
pp. 1-1(1)

Electron microscopy and diffraction of defects, nanostructures, interfaces and amorphous materials Conference to mark the retirement of Professor David Cockayne FRS Oxford, 7 September 2009
pp. 4595-4595(1)
Authors: Hirsch, Peter; Kirkland, Angus; Nellist, Peter

Professor D.J.H. Cockayne FRS: An appreciation in honour of his retirement in September 2009
pp. 4597-4609(13)
Author: Hirsch, P. B.

The development and early applications of the weak-beam technique
pp. 4611-4622(12)
Author: Whelan, M. J.

The temperature dependence of heavy-ion damage in iron: A microstructural transition at elevated temperatures
pp. 4623-4634(12)
Authors: Yao, Z.; Jenkins, M. L.; Hernandez-Mayoral, M.; Kirk, M. A.

Electron microscopy of severely deformed L12 intermetallics
pp. 4635-4645(11)
Authors: Geist, D.; Gammer, C.; Mangler, C.; Rentenberger, C.; Karnthaler, H. P.

Application of electron optical techniques to the study of amorphous materials
pp. 4647-4660(14)
Author: Howie, A.

Fluctuation electron microscopy of medium-range order in ion-irradiated zircon
pp. 4661-4677(17)
Authors: Zhao, Gongpu; Treacy, Michael; Buseck, Peter

Applications of electron reduced density function analysis to the study of amorphous materials: An example of Zr64.13Cu15.75Ni10.12Al10.0 and Zr55Cu30Ni5Al10 metallic glasses
pp. 4679-4689(11)
Authors: Borisenko, Konstantin; Chen, Yixin; Li, Guoqiang

A coherent photofield electron source for fast diffractive and point-projection imaging
pp. 4691-4702(12)
Authors: Spence, J. C. H.; Vecchione, T.; Weierstall, U.

The interdependency of morphology, strain and composition in buried GeSi/Si(001) quantum dots
pp. 4703-4709(7)
Author: Lang, Christian

Dislocation electron tomography and precession electron diffraction - minimising the effects of dynamical interactions in real and reciprocal space
pp. 4711-4730(20)
Authors: Barnard, J. S.; Eggeman, A. S.; Sharp, J.; White, T. A.; Midgley, P. A.

Atomic-resolution spectroscopic imaging of oxide interfaces
pp. 4731-4749(19)
Authors: Kourkoutis, L. Fitting; Xin, H. L.; Higuchi, T.; Hotta, Y.; Lee, J. H.; Hikita, Y.; Schlom, D. G.; Hwang, H. Y.; Muller, D. A.

Applications of the Oxford-JEOL aberration-corrected electron microscope
pp. 4751-4767(17)
Authors: Nellist, P. D.; Kirkland, A. I.

The growth and characterization of Si and Ge nanowires grown from reactive metal catalysts
pp. 4769-4778(10)
Authors: Ross, F. M.; Wen, C. -Y.; Kodambaka, S.; Wacaser, B. A.; Reuter, M. C.; Stach, E. A.