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Publisher: Taylor and Francis Ltd

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Volume 76, Number 3, 1 September 1997

Point defect concentration development in electron-irradiated bucky onions
pp. 125-132(8)
Authors: Sigle, W.; Redlich, Ph.

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Solute drag and wetting of a grain boundary
pp. 133-138(6)
Authors: D.Weygand; Breichet, Y.; Rabkin, E.; Straumal, B.; Gust, W.

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Continuous thermodynamic-equilibriumglass transition in high-energy grain boundaries?
pp. 143-152(10)
Authors: Keblinski, P.; D.Wolf; Phillpot, S. R.; Gleiter, H.

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High-resolution electron microscopy observation of the gamma-phase in Ti4 Al3 Nb alloy
pp. 167-172(6)
Authors: Sadi, F. A.; Guymont, M.; Servant, C.

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Vibration of an interface between Si and SiO2 during reduction of SiO2
pp. 173-180(8)
Authors: Sukimoto, S.T; Sasaki, K.; Hirayama, T.; Saka, H.

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Degradation defects in electron-beam-pumped Zn-Cd/Se ZnSe graded-index separate-confinement 1 x x heterostructure (GRINSCH) blue and blue-green lasers
pp. 181-188(8)
Authors: Bonard, Jean-Marc; Jean-Daniel; Paggel, Jensj.; Sorba, Lucia; Franciosi, Alfonso; Hervei, Denis; Molva, Engin

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Structure and magnetism of the mu-Al Mn Cr 4 x 1 x approximant phase (0 x 1)
pp. 189-198(10)
Authors: Schenk, T .; Klein, H.; Audier, M.; Simonet, V.; Hippert, F.; Rodriguez-Carvajal, J.; Bellissent, R.

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A new 1/1 crystal approximant to the stable Ti-Zr-Ni icosahedral quasicrystal
pp. 199-206(8)
Authors: Kim, W. J.; Gibbons, P. C.; Kelton, K. F.

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omega phase formation in a physically vapour-deposited Fe-Al alloy
pp. 207-216(10)
Authors: Shao, G.; P.Tsakiropoulos; Manh, D. Nguyen; Pettifor, D. G.

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Transmission electron microscopy study of rf-sputtered (Bi,Pb)2 Sr2 Ca2 Cu3 Oy thin films on MgO substrates
pp. 217-222(6)
Authors: Guldeste, A.; O'Connor, J. D.; Eastell, C. J.; Grovenor, C. R. M.; Goringe, M. J.

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The effect of surface structure on the growth of ceramic thin films
pp. 223-232(10)
Authors: Heffelfinger, Jason R.; Carter, C. Barry

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Absence of photodegradation in amorphous chalcogenide films with a narrow optical bandgap
pp. 233-236(4)
Authors: Hayashi, K.; Hikida, Y.; Shimakawa, K.; Elliott, S. R.

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