Skip to main content
padlock icon - secure page this page is secure

A framework for RFID applications in product lifecycle management

Buy Article:

$61.00 + tax (Refund Policy)

This study introduces an overall framework for radio frequency identification (RFID) applications in product lifecycle management (PLM). Recently, with emerging technologies related to product identification and wireless mobile tele-communication, PLM provides a new environment that enables lifecycle actors to gather and analyse product lifecycle information, and make efficient decisions without spatial and temporal constraints. However, previous research has paid little attention to how to apply the emerging technologies into PLM. To cope with this limitation, in the current study, RFID applications in PLM are dealt with from technical and business viewpoints. To this end, an overall framework for RFID applications in PLM is proposed. It contains the definition of a product embedded information device (PEID) that uses RFID technology, its specification and operation scenarios for each application. Furthermore, application issues and their overall procedures are introduced for each lifecycle phase.
No Reference information available - sign in for access.
No Citation information available - sign in for access.
No Supplementary Data.
No Article Media
No Metrics

Keywords: PLM; RFID; product embedded information device; product identification technologies

Document Type: Research Article

Affiliations: Ecole Polytechnique Federale de Lausanne (EPFL), Laboratory of Computer-Aided Design and Production (STI-IPR-LICP), Lausanne, Switzerland

Publication date: July 1, 2009

More about this publication?
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more