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Publisher: Taylor and Francis Ltd

Volume 32, Number 10, Number 10/December 2005

A Bayesian analysis of directional data using the projected normal distribution
pp. 995-1001(7)
Authors: Nuñez-Antonio, Gabriel; Gutiérrez-Peña, Eduardo

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Testing process capability based on C pm in the presence of random measurement errors
pp. 1003-1024(22)
Authors: Pearn, W.; Shu, M.; Hsu, B.

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Marshall–Olkin extended weibull distribution and its application to censored data
pp. 1025-1034(10)
Authors: Ghitany, M.; Al-Hussaini, E.; Al-Jarallah, R.

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The impact of education on third births. A multilevel discrete-time hazard analysis
pp. 1035-1050(16)
Authors: Callens, Marc; Croux, Christophe

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Robust 2 k factorial design with Weibull error distributions
pp. 1051-1066(16)
Authors: Şenoğlu, Bi˙rdal

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Tolerance intervals for exponentiated scale family of distributions
pp. 1067-1074(8)
Authors: Shirke, D. T.; Kumbhar, R. R.; Kundu, D.

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Optimal designs for compartmental models with correlated observations
pp. 1075-1088(14)
Authors: López-Fidalgo, J.; Rodríguez-Díaz, J.; Sánchez, G.; Santos-Martín, M.

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Robust confidence interval for a residual standard deviation
pp. 1089-1094(6)
Author: Bonett, Douglas

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