ISSN 1040-8436 (Print); ISSN 1547-6561 (Online)
Publisher: Taylor and Francis Ltd
Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic and Optoelectronic Devices pp. 71-124(54) Authors: Kuntze, S.; Ban, D.; Sargent, E.; Dixon-Warren, St.; White, J.; Hinzer, K.
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