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Open Access Radiographic Assessment of Extremity Osseointegration for the Amputee

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Osseointegration (OI) is a bone-anchoring procedure that allows the direct skeletal attachment of a prosthesis through the use of an implant. Transcutaneous OI implants are similar to subcutaneous intramedullary joint implants with some exceptions. Particularly, OI implants are inserted at the distal aspect of the femur, while intramedullary implants are inserted at the proximal aspect of the femur. In this report, an additional adaptation of the radiographic zonal analysis used for intramedullary implants, known as Gruen zones, is introduced to include OI implants of extremity prosthetics. Radiographic zonal analyses and interpretations are proposed. Gruen zones are used for intramedullary implants, which are generally inserted from the proximal aspect of the bone. OI extremity implants are inserted from the distal end of the bone. Therefore, the zonal analysis is inverted. A radiographic zonal analysis has been introduced by the Osseointegration Group of Australia (OGA). This analysis is needed specifically for the clinical evaluation of extremity OI, as significant changes to the bone and OI implant have been reported and need to be clinically described. A classification technique is necessary for establishing treatment guidelines for the extremity osseointegrated implant. The OGA Zonal analysis addresses this need by adapting a common reference standard to osseointegration of the extremity amputee.

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Keywords: AMPUTATION SURGERY; IMPLANT; INTERFACE; PROSTHESIS; SOCKET; TRANSFEMORAL AMPUTATION

Document Type: Research Article

Publication date: September 1, 2016

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  • Technology and Innovation, edited and published by the National Academy of Inventors, is a forum for presenting information encompassing the entire field of applied sciences, with a focus on transformative technology and academic innovation. Regular features of T&I include commentaries contributed by the United States Patent and Trademark Office (USPTO) and in-depth profiles of Fellows of the National Academy of Inventors in every issue.

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