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Optimal Wavelength Selection in Laser Scanning Systems for Improved Spectral Estimation of Object Reflectances and Colors

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Optimal sampling wavelengths are investigated for the application of spectral estimation methods for color measurement with 3D laser scanning systems. Methods based on principal component analysis and on spline interpolation are considered. Unconstrained optimizations of the average ΔE94 color difference over large sets of reflectance curves are used to derive the optimal sets of 3 to 6 sampling wavelengths. It is found that the PCA method is slightly better than the spline method overall, and that the ΔE94 errors are reduced roughly by one half when the number of sampling wavelengths increases by one. Four or five sampling wavelengths become sufficient to bring the average error below the one just noticeable difference benchmark. Spectral estimation with 5 optimal wavelengths using the principal components derived from the OSA-UCS catalog appears adequate for the most demanding applications.
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Document Type: Research Article

Publication date: January 1, 2002

More about this publication?
  • Started in 2002 and merged with the Color and Imaging Conference (CIC) in 2014, CGIV covered a wide range of topics related to colour and visual information, including color science, computational color, color in computer graphics, color reproduction, volor vision/psychophysics, color image quality, color image processing, and multispectral color science. Drawing papers from researchers, scientists, and engineers worldwide, DGIV offered attendees a unique experience to share with colleagues in industry and academic, and on national and international standards committees. Held every year in Europe, DGIV papers were more academic in their focus and had high student participation rates.

    Please note: For purposes of its Digital Library content, IS&T defines Open Access as papers that will be downloadable in their entirety for free in perpetuity. Copyright restrictions on papers vary; see individual papers for details.

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