Active and Passive Electronic Components

Transient Phenomena in Sputtered CdS Photocells
pp. 193-200(8)
Authors: H. Murray; A. Piel

Pulse Counting in Anodic Breakdown Measurements
pp. 201-204(4)
Authors: J. M. Martínez-Duart; J. Baonza; I. Montero; J. M. Albella

Influence of Electrolytes in the Electrical Characteristics of Anodic Films on Tantalum
pp. 205-210(6)
Authors: J. M. Martínez-Duart; J. M. Albella; J. Baonza; M. Fernández

Evaluation of Inhomogeneous Resistive Layers by a Four Point Method
pp. 211-216(6)
Authors: László Zombory; Miklós Szilágyi; György Fodor

Empirical Results Establishing the Thermal Independence of the Grain-Boundary Reflection Coefficient
pp. 217-220(4)
Authors: C. R. Tellier; A. J. Tosser; C. R. Pichard

Ni-P as a New Material for Thick Film Technology
pp. 221-226(6)
Authors: A. Misiuk; B. Hołodnik; I. Barycka

Properties of Coplanar Type MIS-SIM Structure Chip Capacitor
pp. 227-228(2)
Authors: S. K. Varshney; Y. K. Jain

Useful Simple Equivalents of Uniformly Distributed R-C (URC¯) Notch Filters
pp. 229-230(2)
Author: U. Kumar

Size Effects in the Thermal Variations of the Hall Coefficient
pp. 231-233(3)
Authors: A. J. Tosser; C. R. Tellier; C. R. Pichard

Hyperbolic Approximate Form of the Mayadas-Shatzkes Function
pp. 235-236(2)
Authors: A. J. Tosser; C. R. Tellier; C. R. Pichard

A Practically Realizable Model of a Uniformly Distributed R-C Network (URC¯)
pp. 237-238(2)
Author: U. Kumar

1980 International Microelectronics Symposium: List of Papers and Abstracts
pp. 239-258(20)

Conference Report
pp. 259-260(2)
Author: D. S. Campbell

Conference Diary
pp. 261-263(3)

Book Reviews
pp. 264-264(1)
Author: D. S. Campbell

Announcement
pp. 265-265(1)