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Free Content Determination of the elemental composition of mature wheat grain using a modified secondary ion mass spectrometer (SIMS)

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An imaging secondary ion mass spectrometry system has been developed that allows the distribution of elements or ions to be superimposed on an image of the plant cell or tissue generated by ion-induced secondary electrons. This system has been evaluated by analysing the aleurone and sub-aleurone cells of mature wheat grain, showing high spatial resolution (100–200 nm) images of O, PO2, Mg+, Ca+, Na+ and K+ within the phytate granules of the aleurone, with CN being diagnostic for proteins and C2 being diagnostic for starch in the starchy endosperm cells. This system should provide improved localization of elements in a range of other plant systems.
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Keywords: SEM; SIMS; ion micro analysis; plant; secondary electron microscopy; secondary ion mass spectrometry; wheat seed

Document Type: Research Article

Affiliations: 1: Interface Analysis Centre, University of Bristol, Oldbury House, 121 St Michael's Hill, Bristol BS21 8BS, UK, and 2: IACR Long Ashton Research Station, Department of Agricultural Sciences, University of Bristol, Long Ashton, Bristol BS41 9AF, UK

Publication date: April 1, 2002

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