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Publisher: Wiley-Blackwell

Volume 19, Number 6, 1 November 2012

International Workshop on Improving Data Quality and Quantity for XAFS Experiments (Q2XAFS 2011)
pp. 849-850(2)
Authors: Ascone, Isabella; Asakura, Kiyotaka; George, Graham N.; Wakatsuki, Soichi

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A step toward standardization: development of accurate measurements of X‐ray absorption and fluorescence
pp. 851-862(12)
Authors: Chantler, Christopher T.; Barnea, Zwi; Tran, Chanh Q.; Rae, Nicholas A.; de Jonge, Martin D.

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XAFS data collection: an integrated approach to delivering good data
pp. 863-868(6)
Authors: Diaz‐Moreno, Sofia

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Towards data format standardization for X‐ray absorption spectroscopy
pp. 869-874(6)
Authors: Ravel, B.; Hester, J. R.; Solé, V. A.; Newville, M.

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X‐ray‐induced photo‐chemistry and X‐ray absorption spectroscopy of biological samples
pp. 875-886(12)
Authors: George, Graham N.; Pickering, Ingrid J.; Pushie, M. Jake; Nienaber, Kurt; Hackett, Mark J.; Ascone, Isabella; Hedman, Britt; Hodgson, Keith O.; Aitken, Jade B.; Levina, Aviva; Glover, Christopher; Lay, Peter A.

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X‐ray absorption spectroscopy at a protein crystallography facility: the Canadian Light Source beamline 08B1‐1
pp. 887-891(5)
Authors: Cotelesage, Julien J. H.; Grochulski, Pawel; Pickering, Ingrid J.; George, Graham N.; Fodje, Michel N.

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IR and X‐ray time‐resolved simultaneous experiments: an opportunity to investigate the dynamics of complex systems and non‐equilibrium phenomena using third‐generation synchrotron radiation sources
pp. 892-904(13)
Authors: Marcelli, Augusto; Innocenzi, Plinio; Malfatti, Luca; Newton, Mark A.; Rau, Julietta V.; Ritter, Eglof; Schade, Ulrich; Xu, Wei

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T‐REX: new software for advanced QEXAFS data analysis
pp. 920-929(10)
Authors: Stötzel, Jan; Lützenkirchen‐Hecht, Dirk; Grunwaldt, Jan‐Dierk; Frahm, Ronald

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Performance and status of beamline BL8 at SLRI for X‐ray absorption spectroscopy
pp. 930-936(7)
Authors: Klysubun, Wantana; Sombunchoo, Panidtha; Deenan, Weeraya; Kongmark, Chanapa

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Time‐resolved XAS (Bonn‐SUT‐SLRI) beamline at SLRI
pp. 937-943(7)
Authors: Poo‐arporn, Yingyot; Chirawatkul, Prae; Saengsui, Worasarit; Chotiwan, Siwarak; Kityakarn, Sutasinee; Klinkhieo, Supat; Hormes, Josef; Songsiriritthigul, Prayoon

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Complete polarization analysis of an APPLE II undulator using a soft X‐ray polarimeter
pp. 944-948(5)
Authors: Wang, Hongchang; Bencok, Peter; Steadman, Paul; Longhi, Emily; Zhu, Jingtao; Wang, Zhanshan

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A variable ultra‐short‐pathlength solution cell for XAFS transmission spectroscopy of light elements
pp. 949-953(5)
Authors: Fulton, John L.; Balasubramanian, Mahalingam; Pham, Van‐Thai; Deverman, George S.

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Single‐exposure dual‐energy‐subtraction X‐ray imaging using a synchrotron source
pp. 954-959(6)
Authors: Carnibella, R. P.; Fouras, A.; Kitchen, M. J.

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In situ beamline analysis and correction of active optics
pp. 960-968(9)
Authors: Sutter, John; Alcock, Simon; Sawhney, Kawal

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QXAFS system of the BL14W1 XAFS beamline at the Shanghai Synchrotron Radiation Facility
pp. 969-975(7)
Authors: Liu, Heng; Zhou, Yongnian; Jiang, Zheng; Gu, Songqi; Wei, Xiangjun; Huang, Yuying; Zou, Yang; Xu, Hongjie

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Accurate dosimetry in scanning transmission X‐ray microscopes via the cross‐linking threshold dose of poly(methyl methacrylate)
pp. 976-987(12)
Authors: Leontowich, Adam F. G.; Hitchcock, Adam P.; Tyliszczak, Tolek; Weigand, Markus; Wang, Jian; Karunakaran, Chithra

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X‐ray photon correlation spectroscopy using a fast pixel array detector with a grid mask resolution enhancer
pp. 988-993(6)
Authors: Hoshino, Taiki; Kikuchi, Moriya; Murakami, Daiki; Harada, Yoshiko; Mitamura, Koji; Ito, Kiminori; Tanaka, Yoshihito; Sasaki, Sono; Takata, Masaki; Jinnai, Hiroshi; Takahara, Atsushi

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Capturing dynamics with Eiger, a fast‐framing X‐ray detector
pp. 1001-1005(5)
Authors: Johnson, I.; Bergamaschi, A.; Buitenhuis, J.; Dinapoli, R.; Greiffenberg, D.; Henrich, B.; Ikonen, T.; Meier, G.; Menzel, A.; Mozzanica, A.; Radicci, V.; Satapathy, D. K.; Schmitt, B.; Shi, X.

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The point‐spread function of fiber‐coupled area detectors
pp. 1006-1011(6)
Authors: Holton, James M.; Nielsen, Chris; Frankel, Kenneth A.

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X‐ray beam monitor made by thin‐film CVD single‐crystal diamond
pp. 1015-1020(6)
Authors: Marinelli, Marco; Milani, E.; Prestopino, G.; Verona, C.; Verona‐Rinati, G.; Angelone, M.; Pillon, M.; Kachkanov, V.; Tartoni, N.; Benetti, M.; Cannatà, D.; Di Pietrantonio, F.

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A 30 nm‐resolution hard X‐ray microscope with X‐ray fluorescence mapping capability at BSRF
pp. 1021-1028(8)
Authors: Yuan, Qingxi; Zhang, Kai; Hong, Youli; Huang, Wanxia; Gao, Kun; Wang, Zhili; Zhu, Peiping; Gelb, Jeff; Tkachuk, Andrei; Hornberger, Benjamin; Feser, Michael; Yun, Wenbing; Wu, Ziyu

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Regridding reconstruction algorithm for real‐time tomographic imaging
pp. 1029-1037(9)
Authors: Marone, F.; Stampanoni, M.

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Diffraction‐enhanced X‐ray imaging under low‐temperature conditions: non‐destructive observations of clathrate gas hydrates
pp. 1038-1042(5)
Authors: Takeya, Satoshi; Honda, Kazumasa; Gotoh, Yoshito; Yoneyama, Akio; Ueda, Kazuhiro; Miyamoto, Atsushi; Hondoh, Takeo; Hori, Akira; Sun, Duo; Ohmura, Ryo; Hyodo, Kazuyuki; Takeda, Tohoru

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Coupling transmission electron microscopy with synchrotron radiation X‐ray fluorescence microscopy to image vascular copper
pp. 1043-1049(7)
Authors: Qin, Zhenyu; Lai, Barry; Landero, Julio; Caruso, Joseph A.

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X‐ray velocimetry within the ex vivo carotid artery
pp. 1050-1055(6)
Authors: Jamison, R. A.; Siu, K. K. W.; Dubsky, S.; Armitage, J. A.; Fouras, Andreas

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A hard X‐ray nanoprobe beamline for nanoscale microscopy
pp. 1056-1060(5)
Authors: Winarski, Robert P.; Holt, Martin V.; Rose, Volker; Fuesz, Peter; Carbaugh, Dean; Benson, Christa; Shu, Deming; Kline, David; Stephenson, G. Brian; McNulty, Ian; Maser, Jörg

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Dame Louise Napier Johnson (1940‐2012)
pp. 1061-1063(3)
Authors: Wilson, Keith S.; Stuart, David I.

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Current events
pp. 1064-1065(2)

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