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Publisher: Wiley-Blackwell

Volume 18, Number 5, 1 September 2011

Comparison of
pp. 689-696(8)
Authors: Keyriläinen, Jani; Fernández, Manuel; Bravin, Alberto; Karjalainen‐Lindsberg, Marja‐Liisa; Leidenius, Marjut; von Smitten, Karl; Tenhunen, Mikko; Kangasmäki, Aki; Sipilä, Petri; Nemoz, Christian; Virkkunen, Pekka; Suortti, Pekka

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Nanocomposite characterization on multiple length scales using µSAXS
pp. 697-701(5)
Authors: Li, Ruipeng; Cornaby, Sterling; Kamperman, Marleen; Smilgies, Detlef‐M.

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Measurement of angular distribution of soft X‐ray radiation from thin targets in the tabletop storage ring MIRRORCLE‐20SX
pp. 702-707(6)
Authors: Yamada, Hironari; Minkov, Dorian; Shimura, Yuki; Scourtis, Chris; Ejike, Okoye Kenneth; Hasegawa, Daisuke; Yamada, Mami; Hanashima, Takayasu; Atkinson, Ken

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: a new version of the synchrotron X‐ray optics modelling package
pp. 708-716(9)
Authors: Sanchez del Rio, Manuel; Canestrari, Niccolo; Jiang, Fan; Cerrina, Franco

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Automated sample‐scanning methods for radiation damage mitigation and diffraction‐based centering of macromolecular crystals
pp. 717-722(6)
Authors: Hilgart, Mark C.; Sanishvili, Ruslan; Ogata, Craig M.; Becker, Michael; Venugopalan, Nagarajan; Stepanov, Sergey; Makarov, Oleg; Smith, Janet L.; Fischetti, Robert F.

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Quantum critical point in SmO
pp. 723-727(5)
Authors: Cheng, Jie; Chu, Shengqi; Chu, Wangsheng; Xu, Wei; Zhou, Jing; Zhang, Linjuan; Zhao, Haifeng; Liu, Ronghua; Chen, Xianhui; Marcelli, Augusto; Wu, Ziyu

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The measurement of differential EXAFS modulated by high pressure
pp. 728-732(5)
Authors: Chu, Shengqi; Zheng, Lirong; Zhou, Yingli; Zhou, Aiyu; Zhang, Jing; Che, Rongzheng; Liu, Jing; Hu, Tiandou

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Effects of alkyl side chains on properties of aliphatic amino acids probed using quantum chemical calculations
pp. 733-742(10)
Authors: Ganesan, Aravindhan; Wang, Feng; Brunger, Michael; Prince, Kevin

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X‐ray tomography of morphological changes after freeze/thaw in gas diffusion layers
pp. 743-746(4)
Authors: Je, Junho; Kim, Jongrok; Kaviany, Massoud; Son, Sang Young; Kim, MooHwan

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Two‐dimensional approach to fluorescence yield XANES measurement using a silicon drift detector
pp. 747-752(6)
Authors: Tamenori, Y.; Morita, M.; Nakamura, T.

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In‐line Bragg magnifier based on V‐shaped germanium crystals
pp. 753-760(8)
Authors: Vagovič, Patrik; Korytár, Dušan; Mikulík, Petr; Cecilia, Angelica; Ferrari, Claudio; Yang, Yang; Hänschke, Daniel; Hamann, Elias; Pelliccia, Daniele; Lafford, Tamzin A.; Fiederle, Michael; Baumbach, Tilo

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Carbon contamination of soft X‐ray beamlines: dramatic anti‐reflection coating effects observed in the 1 keV photon energy region
pp. 761-764(4)
Authors: Chauvet, C.; Polack, F.; Silly, M. G.; Lagarde, B.; Thomasset, M.; Kubsky, S.; Duval, J. P.; Risterucci, P.; Pilette, B.; Yao, I.; Bergeard, N.; Sirotti, F.

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European research platform IPANEMA at the SOLEIL synchrotron for ancient and historical materials
pp. 765-772(8)
Authors: Bertrand, L.; Languille, M.‐A.; Cohen, S. X.; Robinet, L.; Gervais, C.; Leroy, S.; Bernard, D.; Le Pennec, E.; Josse, W.; Doucet, J.; Schöder, S.

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Three‐dimensional imaging of chemical phase transformations at the nanoscale with full‐field transmission X‐ray microscopy
pp. 773-781(9)
Authors: Meirer, Florian; Cabana, Jordi; Liu, Yijin; Mehta, Apurva; Andrews, Joy C.; Pianetta, Piero

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Radiation damage reveals promising interaction position
pp. 782-789(8)
Authors: Koch, Cornelia; Heine, Andreas; Klebe, Gerhard

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Milli‐electronvolt monochromatization of hard X‐rays with a sapphire backscattering monochromator
pp. 802-810(9)
Authors: Sergueev, I.; Wille, H.‐C.; Hermann, R. P.; Bessas, D.; Shvyd'ko, Yu. V.; Zając, M.; Rüffer, R.

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Application of X‐ray fluorescence to turbulent mixing
pp. 811-815(5)
Authors: Kastengren, Alan; Powell, Christopher F.; Dufresne, Eric M.; Walko, Donald A.

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Design of an anaerobic sample chamber for fluorescence measurements compatible with the Lytle detector
pp. 816-817(2)
Authors: Shibata, Tomohiro; Zyryanov, Vladislav N.; Chattopadhyay, Soma

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Current events
pp. 819-821(3)

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