Skip to main content
padlock icon - secure page this page is secure

Characterization of Domains Reorientation in Multilayer Piezoelectric Ceramic Actuators by Polarized Raman Spectroscopy

Buy Article:

$52.00 + tax (Refund Policy)

Polarized Raman spectroscopy was applied to characterize domains reorientation in the multilayer piezoelectric ceramic actuators during the poling process and in the near crack tip zone. It is found that the relative intensity of the vibration modes of E(2TO) and E(3TO + 2LO) + B1 (I E (2 TO ) /I silent ) is affected by electric field and mechanical stress. During the poling process, I E (2 TO ) /I silent increases when the applied DC electric field exceeds the coercive electric field. In the near crack tip zone, the I E (2 TO ) /I silent mapping indicates that near the crack tip zone indicated that the domains were reoriented and the mapping of Raman shift of E(3TO + 2LO) + B1 mode reveals the stress release caused by crack development. This study also confirms that the relative intensity of I E (2 TO ) /I silent can be used for characterization of domains reorientation in PZT‐based ceramics under electric and mechanical stresses.
No References
No Citations
No Supplementary Data
No Article Media
No Metrics

Document Type: Research Article

Publication date: September 1, 2012

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more