Skip to main content
padlock icon - secure page this page is secure

Structural Evolution and Its Effects on Dielectric Loss in Sr

Buy Article:

$52.00 + tax (Refund Policy)

The structural evolution of Sr1−x Sm1+x Al1−x Ti x O4 (x=0, 0.05, 0.10, and 0.15) microwave dielectric ceramics was investigated together with its effects on dielectric loss. Through the analysis of Rietveld refinement of powder X‐ray diffraction, the normalized bond length and normalized bond valence showed an abnormal variation of Sr/Sm–O(2b) and Al/Ti–O(2) bonds from x=0.10 to x=0.15. The abnormal variation related to these bonds in Raman spectra and IR reflectivity spectra was observed. IR reflectivity spectra were calculated by the classical oscillator model fitting to evaluate the intrinsic loss. The calculated Q × f value and the measured ones both decreased as x increased, and a sharp decrease from x=0.10 to x=0.15 was observed. The decreased tolerance factor should be responsible for the decreased Q × f value. Moreover, the abnormal evolution of Sr/Sm–O(2)–Al/Ti bonding that can cause an extra local stress should be responsible for the sharp decrease from x=0.10 to x=0.15 in Q × f value.
No References
No Citations
No Supplementary Data
No Article Media
No Metrics

Document Type: Research Article

Affiliations: Laboratory of Dielectric Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China

Publication date: August 1, 2011

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more