Skip to main content
padlock icon - secure page this page is secure

Local Phenomena in Oxides by Advanced Scanning Probe Microscopy

Buy Article:

$52.00 + tax (Refund Policy)

In the last two decades, scanning probe microscopies (SPMs) have become the primary tool for addressing structure and electronic, mechanical, optical, and transport phenomena on the nanometer and atomic scales. Here, we summarize basic principles of SPM as applied for oxide materials characterization and present recent advances in high-resolution imaging and local property measurements. The use of advanced SPM techniques for solutions of material related problems is illustrated on the examples of grain boundary transport in polycrystalline oxides and ferroelectric domain imaging and manipulation. Future prospects for SPM applications in materials science are discussed.
No References
No Citations
No Supplementary Data
No Article Media
No Metrics

Document Type: Research Article

Affiliations: 1: Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 2: Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104

Publication date: May 1, 2005

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more