Advanced multi-sensor and multi-source industrial computed tomography systems
To extend the range of applications for industrial computed tomography systems, different approaches making use of several X-ray sources and detectors are presented. The combination of microfocus sources with high-voltage and high-power sources makes it possible to combine micro-CT and macro-CT applications in a single system. Digital flat panel detectors combined with line detectors allow for fast volumetric scanning and high-quality data acquisition over a wide range of part size. The benefit from multi-sensor and multi-source X-ray tomography systems is demonstrated by results from different applications, with a focus on light metal parts.
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Document Type: Research Article
Affiliations: 1 Hans Wlischmiller GmbH, Klingleweg 8, 88709 Meersgurg, Germany.
Publication date: June 1, 2008
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- Official Journal of The British Institute of Non-Destructive Testing - includes original research and devlopment papers, technical and scientific reviews and case studies in the fields of NDT and CM.
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