Implementation of frequency-modulated thermal wave imaging for non-destructive sub-surface defect detection
Thermal non-destructive testing (TNDT) is a whole field and non-contact technique for defect detection. The present work describes a variant of TNDT for subsurface defect detection based on frequency modulated thermal wave imaging (FMTWI). Use is made of the frequency dependence of thermal diffusion length, to achieve entire depth scanning of a sample in one run. This novel technique overcomes some of the drawbacks associated with traditional pulse and lock-in thermography. Experimental results are presented in support.
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Document Type: Research Article
Affiliations: 1: CARE, Indian Institute of Technology, Delhi, India 2: CARE
Publication date: April 1, 2005
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- Official Journal of The British Institute of Non-Destructive Testing - includes original research and devlopment papers, technical and scientific reviews and case studies in the fields of NDT and CM.
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