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Science of Advanced Materials (SAM) is an interdisciplinary peer-reviewed journal consolidating research activities in all aspects of advanced materials in the fields of science, engineering and medicine into a single and unique reference source. SAM provides the means for materials scientists, chemists, physicists, biologists, engineers, ceramicists, metallurgists, theoreticians and technocrats to publish original research articles as reviews with author's photo and short biography, full research articles and communications of important new scientific and technological findings, encompassing the fundamental and applied research in all latest aspects of advanced materials.

Publisher: American Scientific Publishers

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Volume 9, Number 1, January 2017

Articles

Matrix-Mediated Crystallization of Explosive Materials in Crosslinked Polymer Network
pp. 1-5(5)
Authors: Lee, Soojin; Moon, Taewoo; Kwon, Kuktae; Kim, Jin Seuk; Kim, Jungwook; Shin, Kwanwoo

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Improvements of Stress Migration in Nano-Scaled Copper Interconnects
pp. 11-16(6)
Authors: Lee, Chang-Chun; Wang, Wei-Chien; Huang, Pei-Chen; Liou, Yan-Yu; Liu, Hsing-Ning

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Surface Properties of Nano-Film Type Patterning Electrode on Flexible Substrate for Bending Test
pp. 17-21(5)
Authors: Wen, Bor-Jiunn; Lee, Chang-Chun; Chang, Ming-Wei; Lin, Hsuan-Kai; Liou, Yan-Yu; Cheng, Sen-Wen

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Mesoporous -Alumina/Hematite (-Al2O3/Fe2O3) Composite Nanofibers for Heavy Metal Removal
pp. 22-29(8)
Authors: Nalbandian, Michael J.; Zhang, Miluo; Sanchez, Joel; Nam, Jin; Cwiertny, David M.; Myung, Nosang V.

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Highly Wrinkled and Porous Nitrogen Doped Graphene with High Electrochemical Activity for Supercapacitor
pp. 30-33(4)
Authors: Yoo, Heejoun; Yoon, Yeoheung; Kim, Tae Young; Suh, Kwang S.; Lee, Hyoyoung

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Cu-Based Spinels for Catalytic Hydrogenolysis of Glycerol to 1,2-Propanediol
pp. 34-41(8)
Authors: Luadthong, Chuleeporn; Kuboon, Sanchai; Ratanatawanate, Chalita; Nualpaeng, Waraporn; Viriya-Empikul, Nawin; Faungnawakij, Kajornsak; Pavasant, Prasert

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Thermal and Electric-Field Annealing Effects on the Optical Properties of PTB7:PC71BM Films for Organic Photovoltaics
pp. 48-51(4)
Authors: Park, Han Gyeol; Diware, Mangesh S.; Kim, Tae Jung; Kang, Yu Ri; Park, Jae Chan; Nam, Koo Hyun; Kim, Young Dong

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A Special Section

A Special Section on Instrumental Development and Application of Atomic Force Microscopy
pp. 52-54(3)
Authors: Zhong, Jian; Sha, Yinlin; Gan, Yang; Shang, Guangyi

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Foreword

Atomic Force Microscopy (AFM) the Ultimate Nano Toolkit
pp. 55-55(1)
Author: Gerber, Christoph

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Reviews

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Self-Assembly of Amyloid-Like Peptides at Interfaces Investigated by Atomic Force Microscopy
pp. 65-76(12)
Authors: Lei, Haozhi; Zhang, Xueqiang; Hu, Jun; Zhang, Yi

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A Mini Review of the Key Components used for the Development of High-Speed Atomic Force Microscopy
pp. 77-88(12)
Authors: Cai, Wei; Liu, Zhengliang; Chen, Yan; Shang, Guangyi

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Application of Atomic Force Microscopy in Understanding Crystallization Process
pp. 89-101(13)
Authors: Gao, Yuan; Wang, Jingkang; Zhong, Jian; Wang, Yongli; Yin, Qiuxiang; Hou, Baohong; Hao, Hongxun

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Electrochemical Scanning Tunneling Microscopy Analysis on Protein Based Electronic Devices
pp. 102-121(20)
Authors: Yagati, Ajay Kumar; Lee, Ji-Young; Nam, Eun-Sook; Cho, Sungbo; Choi, Jeong Woo

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Articles

Effect of Surface Roughness on the Measurement of Boundary Slip Based on Atomic Force Microscope
pp. 122-127(6)
Authors: Pan, Yunlu; Jing, Dalei; Zhao, Xuezeng

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Combined Recognition Imaging and Force Spectroscopy: A New Mode for Mapping and Studying Interaction Sites at Low Lateral Density
pp. 128-134(7)
Authors: Koehler, Melanie; Macher, Gabriel; Rupprecht, Anne; Zhu, Rong; Gruber, Hermann J.; Pohl, Elena E.; Hinterdorfer, Peter

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Atomic Force Microscopy Analysis of Deformation of Single Cytochrome CYP102A1 Molecules
pp. 135-143(9)
Authors: Bukharina, N. S.; Pleshakova, T. O.; Ziborov, V. S.; Fokin, D. A.; Ivanova, N. D.; Ivanov, Yu. D.

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AFM Study on the Boundary Condition, Surface Potential and the Viscosity of the Magnetic Treated Liquids
pp. 144-150(7)
Authors: Pan, Yunlu; Ahmad, Khurshid; Jing, Dalei; Zhao, Xuezeng

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Scanning Near Field Circular Polarization Optical Microscope for Measuring Magnetic Nanodot Arrays
pp. 151-155(5)
Authors: Jin, Tao; Shen, Lu; Hosaka, Sumio; Yin, You; Miura, Takeshi; Hou, Wenmei

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