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Electrochromism in WO x and W x Si y O z Thin Films Prepared by Magnetron Sputtering at Glancing Angles

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This work reports the electrochromic evaluation of W x Si y O z and WO x glad thin films deposited by reactive magnetron sputtering at glancing angle. Their electrochemical properties were assessed by the analysis of cyclic voltammetry and chronoamperometry measurements in 0.1 M HClO4, whereas their optical properties were determined by studying their transmission and absorption spectra under operation conditions. Both types of thin films presented outstanding electrochromic properties characterized by a fast response, a high coloration and a complete reversibility after more than one thousand cycles.
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Keywords: ELECTRICAL PROPERTIES; ELECTROCHROMIC THIN FILMS; GLAD; OPTICAL PROPERTIES; REACTIVE MAGNETRON SPUTTERING

Document Type: Short Communication

Publication date: 01 January 2013

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  • Nanoscience and Nanotechnology Letters (NNL) is a multidisciplinary peer-reviewed journal consolidating nanoscale research activities in all disciplines of science, engineering and medicine into a single and unique reference source. NNL provides the means for scientists, engineers, medical experts and technocrats to publish original short research articles as communications/letters of important new scientific and technological findings, encompassing the fundamental and applied research in all disciplines of the physical sciences, engineering and medicine.
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