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Nanoscience and Nanotechnology Letters (NNL) is a multidisciplinary peer-reviewed journal consolidating nanoscale research activities in all disciplines of science, engineering and medicine into a single and unique reference source. NNL provides the means for scientists, engineers, medical experts and technocrats to publish original short research articles as communications/letters of important new scientific and technological findings, encompassing the fundamental and applied research in all disciplines of the physical sciences, engineering and medicine.

Publisher: American Scientific Publishers

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Volume 4, Number 9, September 2012

A Special Issue

A Special Issue on Micro/Nano-Patterning and Nanoelectronics
pp. 859-861(3)
Authors: Fu, Richard Y. Q.; Wang, Liping; Liu, Yang; Huang, Wei Min

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Review

Thermo/Chemo-Responsive Shape Memory Effect for Micro/Nano Surface Patterning Atop Polymers
pp. 862-878(17)
Authors: Zhao, Y.; Huang, W. M.; Wang, C. C.

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Communications

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Electronic Properties of Microscale Reduced Graphene Oxide Patterned by Micromolding
pp. 889-894(6)
Authors: Zhang, Jia; Wang, Zhenlong; Hu, Ping An; Fu, Yong Qing; Placido, Frank

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Study of Orientation Effects of Grooves on the Film Thickness in Hydrodynamic Lubrication
pp. 895-900(6)
Authors: Yang, S. Y.; Guo, F.; Wang, H. F.

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Micro/Nano-Texture Design for Improving Tribological Properties of DLC-IL Composite Films
pp. 901-909(9)
Authors: Zhao, Wenjie; Wang, Yongxin; Zeng, Zhixiang; Wu, Xuedong; Chen, Jianmin; Xue, Qunji

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Low-Friction Performance of Stearic Acid Modification of Nano-Textured ZnO Coating
pp. 910-913(4)
Authors: Wan, Yong; Wang, Yinhu; Zhang, Quan; Wang, Zhongqian

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Design of Nano-Scale Noise Tolerant CMOS Logic Circuits Based on Probabilistic Markov Random Field Approach
pp. 914-918(5)
Authors: Lu, Zheng Hao; Yu, Xiao Peng; Liu, Yang; Su, Jia Ning; Hu, Chang Hui

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A Sub-1 V Bandgap Reference Based on Different Threshold MOSFETs Under 40 nm Process
pp. 919-923(5)
Authors: Ning, Ning; Feng, Chunyi; Xu, Zhentao; Wu, Shuangyi; Wu, Kejun; Luo, Rui; Yu, Qi

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Considerations and Optimization of Measurement Accuracy of Capacitance in Nano-Scale CMOS Technology
pp. 924-929(6)
Authors: Cao, Si Han; Yu, Xiao Peng; Pan, Yun; Shi, Zheng; Hu, Chang Hui

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Circuits Design for Contactless Testing of Nano-Scale CMOS Devices and Circuits
pp. 930-935(6)
Authors: Yu, Xiao Peng; Lu, Zheng Hao; Lim, Wei Meng; Liu, Yang; Hu, Chang Hui

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Flexible Nanoscale Memory Device Based on Resistive Switching in Nickel Oxide Thin Film
pp. 940-943(4)
Authors: Yu, Q.; Lim, W. M.; Hu, S. G.; Chen, T. P.; Deng, L. J.; Liu, Y.

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Correlation Between Electrical Properties Degradation and Short-Channel Effects in Nano-Gate AlGaN/GaN High Electron Mobility Transistors
pp. 944-947(4)
Authors: Du, Jiangfeng; Zhang, Xinchuan; Feng, Zhihong; Dun, Shaobo; Zhao, Ziqi; Yin, Jianglong; Ma, Kunhua

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