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Materials Focus is a multidisciplinary peer-reviewed journal with a very wide-ranging coverage, consolidates fundamental and applied research aspects in all areas of science and engineering of novel advanced materials including their synthesis, processing, spectroscopy, properties and device applications. The journal publishes full research papers, timely review articles, and short communications of important new scientific findings, encompassing all fundamental and applied research aspects of emerging advanced materials.

Publisher: American Scientific Publishers

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Volume 7, Number 3, June 2018

Review

Quantitative Evolution of Wetting Phenomena for Super Hydrophobic Surfaces
pp. 305-315(11)
Authors: Padhi, Sandhya; Gosavi, Suresh; Yadav, Ramdayal; Kandasubramanian, Balasubramanian

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Scanning Electron Microscope Evaluation of the Poly(vinylidene fluoride)/Multiple-Walled Carbon Nanotubes—Metal Oxides Nanocomposites
pp. 333-337(5)
Authors: Pereira, Esther Lorrayne Machado; Batista, Adriana de Souza Medeiros; Ribeiro, Fabíola A. S.; Soares, Adelina P.; Oliveira, Arno H.; de Faria, Luiz Oliveira

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Growth and Characterization of CuInS2 Thin Films for Photovoltaic Applications
pp. 338-341(4)
Authors: Kotbi, Ahmed; Hartiti, Bouchaib; Fadili, Salah; Ridah, Abderraouf; Thevenin, Philippe

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Electrochemical Study of Galvanostatistically Deposited Cr2O3 Thin Film for Supercapacitor
pp. 342-345(4)
Authors: Kharade, P. M.; Babar, A. R.; Dhasade, S. S.; Karche, B. R.; Salunkhe, D. J.

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Microstructural Evolution of Co3Al Metallic Glass Studied by Molecular Dynamics Simulations
pp. 346-350(5)
Authors: Kbirou, Meryem; Trady, Salma; Hasnaoui, Abdellatif; Saadouni, Khalid; Mazroui, M'hammed

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A Special Section

A Special Section on Screening Length in Nano Materials
pp. 361-362(2)
Authors: Ghatak, Kamakhya Prasad; Chakrabarti, Satyajit; Chatterjee, Biswajoy

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Articles

Influence of Size Quantization on the Screening Length in Non-Parabolic Semiconductors
pp. 363-389(27)
Authors: Paul, R.; Mitra, M.; Chatterjee, B.; Pal, J.; Singh, S. L.; Singh, S. B.; Chakrabarti, S.

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Influence of Intense Electric Field on the Screening Length in Opto-Electronic Materials
pp. 390-404(15)
Authors: Ghatak, K. P.; Chakrabarti, S.; Chatterjee, B.; Das, P. K.; Dutta, P.; Halder, A.

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Screening Length in Doping Superlattices
pp. 405-412(8)
Authors: Biswas, S. K.; Mondal, S.; Bhattacharyya, K.; Pradhan, A. K.; Pal, J.

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Microwaves, Heisenberg's Uncertainty Principle and the Screening Length
pp. 413-423(11)
Authors: Singh, L. S.; Singh, S. B.; Paul, R.; Mitra, M.

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The Screening Length, 2D Opto-Electronic Materials, Intense Photon Field and All That
pp. 424-430(7)
Authors: Debbarma, M.; Debbarma, S.; Debbarma, N.

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Cross-Fields, Opto-Electronic Materials, Intense Light Waves and the Screening Length
pp. 431-437(7)
Authors: Chatterjee, B.; Mitra, M.; Pal, J.; Debbarma, M.

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Accumulation Layers and Their Screening Lengths
pp. 438-452(15)
Authors: Paul, R.; Mitra, M.; Ghatak, S.; Chatterjee, B.; Pal, J.; Chakrabarti, S.

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