Journal of Scanning Probe Microscopy

ISSN 1557-7937 (Print)
Ceased publication in 2018

Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.

Journal of Scanning Probe Microscopy is now published as Journal of Advanced Microscopy Research.

Publisher: American Scientific Publishers

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Scanning Probe Microscopy for Surface Roughness Characterization of Lactose Carriers Used in Dry Powder Inhalation Therapy
pp. 5-9(5)
Authors: Karande, A. D.; Zhou, Q.; Chan, L. W.; Heng, P. W. S.; Liew, C. V.

Structural Integrity and Transport Characteristics of STM-Defined, Highly-Doped Si:P Nanodots
pp. 10-14(5)
Authors: Rueß, Frank J.; Pok, Wilson; Reusch, Thilo C. G.; Scappucci, Giordano; Füchsle, Martin; Mitic, Mladen; Thompson, Daniel L.; Simmons, Michelle Y.

Nanoscale Acoustic Near-Field Imaging in an SEM/SPM Hybrid System with Sub-Picometer Sensitivity
pp. 15-18(4)
Authors: Thomas, Ch.; Heiderhoff, R.; Balk, L. J.

Study and Manipulation of Single Functionalized Molecules by Low Temperature STM
pp. 19-23(5)
Authors: Grill, L.; Alemani, M.; Rieder, K.-H.; Moresco, F.; Rapenne, G.; Joachim, C.; Peters, M. V.; Hecht, S.

Surface Characterization of TaN-Cu Nanocomposite Thin Films Using Scanning Surface Potential Microscopy
pp. 24-27(4)
Authors: Hsieh, J. H.; Liu, P. C.; Cheng, M. K.; Kuo, P. W.

Effects of Tip Voltage and Writing Speed on the Formation of Silicon Oxide Nanodots Patterned by Scanning Probe Lithography
pp. 28-31(4)
Authors: Hutagalung, Sabar D.; Darsono, Teguh; Yaacob, Khatijah A.; Ahmad, Zainal A.

Polymerization on DNA Templates for Nanoelectronics Applications
pp. 32-35(4)
Authors: Rajwade, S. R.; Kulkarni, P. D.; Mukherji, S.; Rao, K. K.; Ramgopal Rao, V.

Morphological and Interfacial Investigations at Ni/Si System
pp. 36-40(5)
Authors: Agarwal, Shivani; Jain, Ankur; Karar, N.; Chakraborty, B. R.; Gupta, Ajay; Jain, I. P.

Dynamics of Phospholipid Membrane Growth and Drug-Membrane Interactions Probed by Atomic Force Microscopy
pp. 41-45(5)
Authors: Nussio, Matthew R.; Liddell, Matthew; Sykes, Matthew J.; Miners, John O.; Shapter, Joseph G.

Vorticella Stalk Characterization via Atomic Force Microscopy
pp. 46-50(5)
Authors: Andrade, M. F.; Valdez, M.; Virgen-Ortiz, A.; Trujillo, X.; Huerta, M.; Marin, J. L.

Imaging of Pristine and Functionalized Carbon Nanotubes by Scanning Tunneling Microscopy
pp. 51-57(7)
Authors: Wei, Guoxiu; Greiner, Mark T.; Kruse, Peter

Atomic Force Microscopy Studies of Silver Nanoislands Synthesised from Aspergillus versicolor
pp. 58-62(5)
Authors: Gopalakrishnan, C.; Ramaswamy, Shivaraman; Memoriya, Usha

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